±10μm · Film/Tray-to-Tray/Film · 12" Wafer
RX3000 is a turnkey sorting platform for high-value chips, supporting laser diodes, special-structure devices, and more. It offers four sorting modes: film-to-film, film-to-waffle pack, waffle pack-to-film, and waffle pack-to-waffle pack, and handles 6/8/12-inch wafers, waffle packs, and gel packs.
With closed-loop force control, Class 100 clean environment, and intelligent software, it enables damage-free sorting of ultra-thin, irregular, and fragile chips, plus wafer map binning.
RX3000 series: 100+ systems shipped, 10+ years production-proven, serving 30+ customers
Real-time force curve display and recording
Standard force: 50~150g
Optional 10g low-force control
Rotary wafer stage 180° / 90° flip sorting
6/8/12" wafer compatible
Wafer ring / sub-ring
Auto wafer load/unload
Waffle pack / gel-pak
1,000+ recipes
Auto calibration system
7 nozzle tools
5 ejector pin options
Class 10K/1K/100 cleanroom options
Wafer de-static module
Custom nozzle tooling
Multi-segment / sync ejector options
Multi-stage force control customization
Wafer mapping read & generate
Barcode / 2D code recognition
Assisted OCR
Assisted AOI
Custom network & MES integration
| 参数项 | RX3000 Standard | RX3000 Upgrade | RX3000 ADV |
|---|---|---|---|
| Placement Accuracy | ±38μm θ:±3° |
±25μm θ:±1° |
±10μm θ:±0.5° |
| UPH | 2000 | 1500 | 1200 |
| Bond Force Range | Standard 50~100g±5g, 100~150g±10% Custom: 10~30g±3g, 30~150g±5g, 150~300g±10% |
Standard 50~100g±5g, 100~150g±10% Custom: 10~30g±3g, 30~150g±5g, 150~300g±10% |
Standard 50~100g±5g, 100~150g±10% Custom: 10~30g±3g, 30~150g±5g, 150~300g±10% |
| Standard Condition | Die: 2×2×0.1mm, no look-up, no aux functions, die accuracy ±2μm, 8" wafer to wafer | Die: 2×2×0.1mm, no look-up, no aux functions, die accuracy ±2μm, 8" wafer to wafer | Die: 2×2×0.1mm, no look-up, no aux functions, die accuracy ±2μm, 8" wafer to wafer |
| Supported Die Size | Die: 0.3–10mm Thickness: 100μm<T<350μm (Out-of-range: sample validation available) |
Die: 0.3–10mm Thickness: 100μm<T<350μm (Out-of-range: sample validation available) |
Die: 0.3–10mm Thickness: 100μm<T<350μm (Out-of-range: sample validation available) |
| AOI Function | Physical defect detection: chipping, cracks, scratches, contamination Die 0.3–5mm, detection ≥25μm; brightness ratio > 25% |
Physical defect detection: chipping, cracks, scratches, contamination Die 0.3–5mm, detection ≥25μm; brightness ratio > 25% |
Physical defect detection: chipping, cracks, scratches, contamination Die 0.3–5mm, detection ≥25μm; brightness ratio > 25% |
| Up-look Inspection | Die alignment & ejector mark inspection | Die alignment & ejector mark inspection | Die alignment & ejector mark inspection |
| Auto Load/Unload | Auto wafer ring load/unload | Auto wafer ring load/unload | Auto wafer ring load/unload |
| Input method | Wafer frame(iron ring): 12" ,8",6" Grip ring(expander ring) ring 6",8" Gel-pak/waffle pack: 2", 4" optional |
Wafer frame(iron ring): 12" ,8",6" Grip ring(expander ring) ring 6",8" Gel-pak/waffle pack: 2", 4" optional |
Wafer frame(iron ring): 12" ,8",6" Grip ring(expander ring) ring 6",8" Gel-pak/waffle pack: 2", 4" optional |
| Output method | Wafer frame(iron ring): 12" ,8",6" Grip ring(expander ring) ring 6",8" Gel-pak/waffle pack: 2", 4" optional |
Wafer frame(iron ring): 12" ,8",6" Grip ring(expander ring) ring 6",8" Gel-pak/waffle pack: 2", 4" optional |
Wafer frame(iron ring): 12" ,8",6" Grip ring(expander ring) ring 6",8" Gel-pak/waffle pack: 2", 4" optional |
| Wafer Rotation | Upgradeable to ±180° | Upgradeable to ±180° | Upgradeable to ±180° |
| Miss Die Detection | Vacuum detection | Vacuum detection | Vacuum detection |
| Wafer De-Static | Ionizer | Ionizer | Ionizer |
| Ink Dot Inspection | Supported | Supported | Supported |
| Wafer Map | Supported | Supported | Supported |
| Software | RX3000 CN/EN version | RX3000 CN/EN version | RX3000 CN/EN version |
Die transfer between wafer films
Die transfer between trays
Sort dies from wafer film into trays
Rearrange trayed dies onto wafer film
Sort different projects and grades from a single wafer into different carriers per wafer map
Sort different bin-grade dies from source film to new film or waffle packs per wafer map
Custom position and pattern array placement for non-standard process requirements
RX3000 covers IC, optical communications, power semiconductors, RF, and MEMS applications
QFP / BGA / LGA / QFN traditional packages
GPU / NPU / HBM high-performance computing
IMU, pressure sensors, micromirrors, MEMS devices
MMIC / PA / LNA microwave RF devices
VCSEL / EML / silicon photonics high-precision sorting
Flexible config from R&D to pilot to volume production
ACCURACY provides full technical support from process evaluation through production, with modular configuration to meet diverse production needs.
Submit die specs, carrier types, throughput targets. Our team delivers a feasibility report and recommended configuration (accuracy, force control, cleanroom level, handling).
Run your actual dies at our demo center. We provide complete sorting reports with process recommendations. Free sample trials available.
Full system commissioning, on-site training. One operator can master the system. Standard delivery within 45 days.
8-hour response + 48-hour on-site in China. Continuous process optimization and fast spare parts supply.
我们的技术团队将根据您的具体需求,提供定制化解决方案和详细技术资料